Friday, January 13, 2012

Igbt Test Procedures

!±8± Igbt Test Procedures

The term Igbt is an acronym for Insulated Gate Bipolar Transistor. It can be plan of as a Transistor with a Mosfet front end. It has three terminals (or leads) labeled Gate, collector and Emitter. Some Igbt's have a built in security diode. This diode is connected over the collector and Emitter terminals. It is added for transient voltage security when the Igbt is switching Inductive loads.

When these devices are thought about 'suspect' it is vital to validate their carrying out straight through a functional test procedure. One of two methods can be used:

The first test formula will validate the health of the security diode, and the resistance of the collector and Emitter terminals. It is not a definitive test, but will find 80% of all faulty devices. This is due to the fact that most faulty Igbt's show a low resistance or short over the collector and Emitter terminals when the device is stressed.

To achieve this test will require a Dvm (Digital-Volt-Meter). Set the Dvm to the Diode Test position, and confirm that the device tests as follows:

Attach the Red Lead of the Dvm to the collector concluding and Black Lead to the Emitter Terminal. Confirm an open circuit condition.

Attach the Red Lead of the Dvm to the Emitter concluding and Black Lead to the collector Terminal. Confirm an open circuit health (Igbt without a security diode). If the Dvm displays a send voltage drop of 0.2 to 0.8 Vdc it means that the Igbt has a built in security diode. Both of these results are general test conditions and are used to confirm either the Igbt has a security diode, and if it does, either it is functional or not.

The second test formula will check the Igbt's functionality, by gating the device. To achieve this test will require an Igbt Tester. Confirm that the device tests as follows:

Attach the Igbt Tester leads to the Gate, collector and Emitter Terminals. Confirm that the device Conduction Led is not lit.

Press the Test Button, and confirm that the Conduction Led lights.

Reverse the collector and Emitter leads. Do not press the Test Button. If the Conduction Led lights the Igbt has a built in security diode. This is a general test health for this type of device. If the Conduction Led does not light then the Igbt does not have a built in security diode. This is also a general test health for this type of device.

It is important to note that Functional test of the Igbt should all the time be performed when the device is out-of-circuit. In other words, it should be removed from the product and have no other electrical connections in place, other than those outlined in the Test procedure.


Igbt Test Procedures

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Monday, January 2, 2012

Leviton 390-1W Medium Base, Bi-Pin, Standard Fluorescent Lampholder, Pedestal, Screw Mount, Turn-Type, 2-Screw Terminal, White

!±8± Leviton 390-1W Medium Base, Bi-Pin, Standard Fluorescent Lampholder, Pedestal, Screw Mount, Turn-Type, 2-Screw Terminal, White


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Leviton 109-390-1WH Fluorescent Lampholder, White Leviton 109-390-1WH Fluorescent Lampholder, White Features: Medium bi-pin, screw terminal Easy to wire Lamp locks in place For use with 14 to 20 watt fluorescent Furnished with mounting screw and nut 600 volts 660 watt White Body 1" wide, 1-7/16" at base x 2-7/16" overall height

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Friday, December 16, 2011

Electrochromism in graphene - 2

We demonstrate that graphene oxide can be reversibly reduced and oxidized using electrical stimulus. Controlled reduction and oxidation in two-terminal devices containing multilayer graphene oxide films are shown to result in switching between partially reduced graphene oxide and graphene, a process which modifies the electronic and optical properties. High-resolution tunneling current and electrostatic force imaging reveal that graphene oxide islands are formed on multilayer graphene, turning graphene into a self-assembled heterostructure random nanomesh. Charge storage and resistive switching behavior is observed in two-terminal devices made of multilayer graphene oxide films, correlated with electrochromic effects. Tip-induced reduction and oxidation are also demonstrated. Results are discussed in terms of thermodynamics of oxidation and reduction reactions. pubs.acs.org

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